Industrial SV250-M242 BiCS5 Product Specifications

Scope and location

Exact named pinout variant only; not capability or compatibility approval.

printed p. 5 (PDF p. 6), Table 3-1 Pin Assignments, row 1; printed p. 5 (PDF p. 6), Table 3-1 Pin Assignments, row 10; printed p. 5 (PDF p. 6), Table 3-1 Pin Assignments, row 11; printed p. 5 (PDF p. 6), Table 3-1 Pin Assignments, row 2; printed p. 5 (PDF p. 6), Table 3-1 Pin Assignments, row 20; printed p. 5 (PDF p. 6), Table 3-1 Pin Assignments, row 21; printed p. 5 (PDF p. 6), Table 3-1 Pin Assignments, row 22; printed p. 5 (PDF p. 6), Table 3-1 Pin Assignments, row 3; printed p. 5 (PDF p. 6), Table 3-1 Pin Assignments, row 4; printed p. 5 (PDF p. 6), Table 3-1 Pin Assignments, row 5; printed p. 5 (PDF p. 6), Table 3-1 Pin Assignments, row 6; printed p. 5 (PDF p. 6), Table 3-1 Pin Assignments, row 7; printed p. 5 (PDF p. 6), Table 3-1 Pin Assignments, row 8; note 1 on printed p. 7; printed p. 5 (PDF p. 6), Table 3-1 Pin Assignments, row 9; printed p. 6 (PDF p. 7), Table 3-1 Pin Assignments, row 23; printed p. 6 (PDF p. 7), Table 3-1 Pin Assignments, row 24; printed p. 6 (PDF p. 7), Table 3-1 Pin Assignments, row 25; printed p. 6 (PDF p. 7), Table 3-1 Pin Assignments, row 26; printed p. 6 (PDF p. 7), Table 3-1 Pin Assignments, row 27; printed p. 6 (PDF p. 7), Table 3-1 Pin Assignments, row 28; printed p. 6 (PDF p. 7), Table 3-1 Pin Assignments, row 29; printed p. 6 (PDF p. 7), Table 3-1 Pin Assignments, row 30; printed p. 6 (PDF p. 7), Table 3-1 Pin Assignments, row 31; printed p. 6 (PDF p. 7), Table 3-1 Pin Assignments, row 32; printed p. 6 (PDF p. 7), Table 3-1 Pin Assignments, row 33; printed p. 6 (PDF p. 7), Table 3-1 Pin Assignments, row 34; printed p. 6 (PDF p. 7), Table 3-1 Pin Assignments, row 35; printed p. 6 (PDF p. 7), Table 3-1 Pin Assignments, row 36; printed p. 6 (PDF p. 7), Table 3-1 Pin Assignments, row 37; printed p. 6 (PDF p. 7), Table 3-1 Pin Assignments, row 38; printed p. 6 (PDF p. 7), Table 3-1 Pin Assignments, row 39; printed p. 6 (PDF p. 7), Table 3-1 Pin Assignments, row 40; printed p. 6 (PDF p. 7), Table 3-1 Pin Assignments, row 41; printed p. 6 (PDF p. 7), Table 3-1 Pin Assignments, row 42; printed p. 6 (PDF p. 7), Table 3-1 Pin Assignments, row 43; printed p. 6 (PDF p. 7), Table 3-1 Pin Assignments, row 44; printed p. 6 (PDF p. 7), Table 3-1 Pin Assignments, row 45; printed p. 6 (PDF p. 7), Table 3-1 Pin Assignments, row 46; printed p. 6 (PDF p. 7), Table 3-1 Pin Assignments, row 47; printed p. 6 (PDF p. 7), Table 3-1 Pin Assignments, row 48; printed p. 6 (PDF p. 7), Table 3-1 Pin Assignments, row 49; printed p. 6 (PDF p. 7), Table 3-1 Pin Assignments, row 50; printed p. 6 (PDF p. 7), Table 3-1 Pin Assignments, row 51; printed p. 6 (PDF p. 7), Table 3-1 Pin Assignments, row 52; printed p. 6 (PDF p. 7), Table 3-1 Pin Assignments, row 53; printed p. 6 (PDF p. 7), Table 3-1 Pin Assignments, row 54; printed p. 6 (PDF p. 7), Table 3-1 Pin Assignments, row 55; printed p. 6 (PDF p. 7), Table 3-1 Pin Assignments, row 56; note 1 on printed p. 7; printed p. 6 (PDF p. 7), Table 3-1 Pin Assignments, row 57; printed p. 6 (PDF p. 7), Table 3-1 Pin Assignments, row 58; note 1 on printed p. 7; printed p. 7 (PDF p. 8), Table 3-1 Pin Assignments, row 67; printed p. 7 (PDF p. 8), Table 3-1 Pin Assignments, row 68; printed p. 7 (PDF p. 8), Table 3-1 Pin Assignments, row 69; printed p. 7 (PDF p. 8), Table 3-1 Pin Assignments, row 70; printed p. 7 (PDF p. 8), Table 3-1 Pin Assignments, row 71; printed p. 7 (PDF p. 8), Table 3-1 Pin Assignments, row 72; printed p. 7 (PDF p. 8), Table 3-1 Pin Assignments, row 73; printed p. 7 (PDF p. 8), Table 3-1 Pin Assignments, row 74; printed p. 7 (PDF p. 8), Table 3-1 Pin Assignments, row 75; printed pp. 5-7 (PDF pp. 6-8), section 3, Table 3-1 and Figure 3-1 top view

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Inspected

2026-10-21

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Recorded AI-assisted source inspection; not independent human approval or hardware testing.

Source scope and unresolved evidence are preserved in the engineering variant.

Source inspection is separate from independent technical approval, rights clearance and hardware testing.