Source S1135 · recorded inspection
Dell M.2 Figure1 labeled card examples
Dell
Scope and location
Document revision: Articleversion12; modified30September2026. 1 recorded locator(s) on this underlying document; this count is not independent corroboration.
Nominal source-example sizes and coarse one-vs-two notch recognition; no measured/notch-position geometry or universal format-to-key/interface rule.
Article000144170 Figure1(b)2242 B/M-keyed example and(d)2280 M-keyed example; primary image inspected.
- Inspected
- 2026-10-23
- Access
- public page
Recorded AI-assisted source inspection; not independent human approval or hardware testing.
Reference illustration only; no normative geometry, contact coordinates, physical measurement, approved mating or performance validation.
Source inspection is separate from independent technical approval, rights clearance and hardware testing.