Source S041 · recorded inspection
SD Standard Overview
SD Association
Scope and location
SD/microSD physical-form and generation-specific contact-count distinctions; no numbered assignments or fabrication drawing.
Conventional-card paragraph and form-factor table: first-row counts and UHS-II / SD Express count ranges
- Inspected
- 2026-10-07
- Access
- public page
Recorded AI-assisted source inspection; not independent human approval or hardware testing.
Counts are scoped to named modes. The overview does not identify an exact card or host, and extra-row count does not establish implemented protocol.
Source inspection is separate from independent technical approval, rights clearance and hardware testing.