FIELD GUIDESource-led reference

Source S041 · recorded inspection

SD Standard Overview

SD Association

Scope and location

SD/microSD physical-form and generation-specific contact-count distinctions; no numbered assignments or fabrication drawing.

Conventional-card paragraph and form-factor table: first-row counts and UHS-II / SD Express count ranges

Open the original source

Inspected
2026-10-07
Access
public page

Recorded AI-assisted source inspection; not independent human approval or hardware testing.

Counts are scoped to named modes. The overview does not identify an exact card or host, and extra-row count does not establish implemented protocol.

Source inspection is separate from independent technical approval, rights clearance and hardware testing.